(last-modified: 08 May 2018)
       - T. Hastie, R. Tibshirani and J. Friedman, The Elements of Statistical Learning: Data Mining, Inference, and Prediction, Springer, 2016.
       - R. O. Duda, P. E. Hart and D. G. Stork, Pattern Classification (2nd ed), John Wiley & Sons, Inc., 2001. (Korean version is available)
       - C. M. Bishop, Pattern Recognition and Machine Learning, Springer, 2006.
       - S. Theodoridis and K. Koutroumbas, Pattern Recognition (3rd ed), Springer, 2006.
       - A. K. Jain, A. Ross, K. Nandakumar, Introduction to Biometrics, Springer, 2011.

    Recent Events:
       - Dr. Beom-Seok OH published a new paper in IEEE Trans. on Image Processing (Jun 2018).
       - Young-Woong KWON and Junsik JUNG joined our lab (Mar 2018).
       - Dr. Kangrok OH published a new paper in Journal of the Franklin Institute (Mar 2018).
       - Kangrok OH is graduated from our lab (Feb 2018).
       - Prof. Kar-Ann Toh published a new paper in Neural Networks (Jan 2018).

    Contact Information:
       Address: #229, Engineering Building C, Yonsei University, 50 Yonsei-ro, SEOUL, Republic of Korea.
       TEL: +82-2-2123-6605
       Senior Member: 
    Jooyoung KIM (harrykim(ATT)yonsei(dott)ac(dott)kr)