Welcome!

Pattern Classification Books:
   - R. O. Duda, P. E. Hart and D. G. Stork, Pattern Classification (2nd ed), John Wiley & Sons, Inc.,2001 (Korean version is now available)
   - C. M. Bishop, Pattern Recognition and Machine Learning, Springer, 2006
   - S. Theodoridis and K. Koutroumbas, Pattern Recognition (3rd ed), Springer, 2006


New Book:
   -Introduction to Biometrics, A. K. Jain, A. Ross, K. Nandakumar, Springer, 2011


Recent Events:
   - MSU's biometric website (Prof. Anil K. Jain's lab.)
   - ICB 2013 (4-7 June 2013, Madrid, Spain)
   - Prof. Anil K. Jain's talk: Clustering Big Data (29 Nov 2012, University of Notre Dame, USA)
   - ICB 2012 (30 March - 1 April 2012, New Delhi, India) 
   - IJCB 2011 (11-13 October 2011, Washington DC, USA)
   - BTAS 2010 (27-29 September 2010, Washington DC, USA)
   - ICIEA 2010 (15-17 June 2010, Taichung, Taiwan)
   - ICARCV 2010 (7-10 December 2010, Singapore)
   - ICB 2009 (2-6 June 2009, Alghero, Italy)  
   - ICIEA 2009 (25-27 May 2009, Xi'an, China)
   - ICARCV 2008 (17-20 Dec 2008, Hanoi, Vietnam)
   - ICEIC 2008 (24-27 Jun 2008, Tashkent, Uzbekistan)
   - ICIEA 2008 (3-5 Jun 2008, Singpore)
   - BTAS 2007 (27-29 Sep 2007, Washington DC, USA)
   - IAPR-ICB 2007 (27-29 Aug 2007, Seoul, Korea)
   - BERC Summer Seminar, 2007 (24 Aug, Seoul, Korea)
   - ICIEA 2007 (23-25 May 2007, Harbin, China)
   - The 5th BERC Biometrics Workshop 2007 (1-2 Feb 2007)
   - KJPR 2006 (23-24 Nov 2006, Jeju Island, Korea )
   - ICEIC 2006 (27-28 June 2006, Mongolia)
   - ICIEA 2006 (24-26 May 2006, Singapore)
   - The 4th BERC Biometrics Workshop 2006 (16-17 Feb 2006)
   - IAPR-ICB 2006 (05-07 Jan 2006)


Contact Information:
   #252, Yonsei Engineering Research Park, Yonsei University, 
   50 Yonsei-ro, SEOUL, Republic of Korea
   TEL: +82-2-2123-6605
Updated 16 July 2015